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New PDF release: Advanced Computing in Electron Microscopy

By Earl J. Kirkland

ISBN-10: 1441965327

ISBN-13: 9781441965325

ISBN-10: 1441965335

ISBN-13: 9781441965332

Advanced Computing in Electron Microscopy, second version, brings jointly assorted info on photo simulation. a useful source, this booklet presents details on quite a few equipment for numerical computation of excessive answer traditional and scanning transmission electron microscope pictures. this article will function a useful tool for college kids on the complicated undergraduate or graduate point, in addition to skilled researchers within the box.

This improved moment version contains:

-descriptions of recent advancements within the field

-updated references

-additional fabric on aberration corrected tools and confocal electron microscopy

-expanded and superior examples and sections to supply superior clarity

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Extra resources for Advanced Computing in Electron Microscopy

Example text

The total integrated current is shown as a dashed line and objective aperture. The graph has been scaled to make hADF (0) = 1. 43(Csλ 3 )1/4 . The transfer function is just the inverse Fourier transform of the point spread function. 70) The transfer function is plotted in Fig. 12 and BF-CTEM and ADF-STEM are compared in Fig. 13. It is interesting to compare an aberration corrected probe and an uncorrected probe [232]. 14 shows a probe at 100 keV with and without an aberration corrector. The curves are normalized to have the same integrated current.

The notation here is similar to that of Krivanek [221]. The Zernike polynomials (for example Sect. 2 of Born and Wolf [34]) are orthogonal over a unit circle and Sheppard [320] has given a general discussion of orthogonal aberration functions. 9 Further Reading Some Books on Electron Microscopy 1. P. R. Buseck, J. M. Cowley and L. , High-Resolution Transmission Electron Microscopy, Oxford Univ. Press, 1988 [43] 2. J. J. Bozzola and L. D. Russell, Electron Microscopy, Princ. and Tech. , 1999 [36] 3.

Some of these are illustrated in image form in Figs. 13 using computational methods that will be described later. These are images of a self-luminous point which is the probe function in STEM neglecting any remaining source size coming from the tip itself. 7 Aberration Correction The most common electron lens is a rotationally symmetric lens similar to that shown in Fig. 2. The fringe field in the gap focus the electron beam. 5 Fig. 5. 8 2 Fig. 5Cs λ . 7 Aberration Correction 21 Fig. 12 Various single aberrations.

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Advanced Computing in Electron Microscopy by Earl J. Kirkland


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